FastSaying

From new chip architectures to advanced lithography technologies, IC manufacturers are innovating more than ever -- and facing new defect inspection challenges. Leveraging key sensitivity enhancements and technology breakthroughs that enable industry-leading throughput, we've again extended our 23XX platform to enable leading-edge chipmakers to achieve faster time to market on advanced chips.

Mike Kirk

AdvancedChipDefectFacingInnovatingInspectionManufacturersTechnologies

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